A Measurement of Aluminium (Al) lonization Cross Section On K-shell;
鋁—K殼層電離截面的測量
Damaging enhancement on Inp[l00] surface induced by K-shell photoionization absorption of phosphorus or indium;
P和In原子K殼層X光吸收對InP單晶表面的損傷增強作用
In this paper, we give a description of recent progress on the measurements of electron-impact K-shell ionization cross-sections of atoms in the keV energy range.
首先評述了近年來該領(lǐng)域的一些研究進展,并通過測量Cr元素在小于26keV能量范圍K殼層電離截面的例子介紹了研究組的實驗方法。